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RE: VLSI Design and Test (PDF) - book24h - 2025-03-14
![[Kép: 5a816a3e02b996ac49324f298946954c.webp]](https://i124.fastpic.org/big/2025/0314/4c/5a816a3e02b996ac49324f298946954c.webp)
Free Download VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers By Brajesh Kumar Kaushik
English | PDF | 2017 | 820 Pages | ISBN : 9811074690 | 96.5 MB
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
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