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RE: VLSI Design and Test (2017) - book24h - 2026-02-06
![[Kép: c741bbd9c6ea9271b6b6e1a66b091fee.webp]](https://i126.fastpic.org/big/2026/0206/ee/c741bbd9c6ea9271b6b6e1a66b091fee.webp)
Free Download VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers By Brajesh Kumar Kaushik
English | PDF | 2017 | 820 Pages | ISBN : 9811074690 | 96.5 MB
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
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